Utilizing state-of-the-art test equipment means SEMITRON is able to test electronic components to manufacturer’s specifications (data sheet) or customer specifications as well as perform function tests.

All test and inspection programmes, even those for custom ICs (ASIC), are developed by SEMITRON engineers.

With systems designed to temper components from -70 °C to +260 °C it is possible to test components across extended temperature ranges – so-called screening.

Portfolio sample of frequently tested components:

• Diodes, MOSFETs, transistors
• Voltage regulators, amplifiers, voltage references, operational amplifiers
• Programmable components (Flash, EEPROM, EPROM, UV EPROM, memory cards) Capacitors, resistors, quartz crystals, oscillators
• Sensors (pressure and temperature) tested for compliance to CECC regulations.